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Fabian Stamer

M.Sc. Fabian Stamer

Room: 110.3
Phone: +49 721 608 46858
Fax: +49 721 358854
fabian stamerNun5∂kit edu

Karlsruher Institut für Technologie (KIT)
Elektrotechnisches Institut (ETI)

KIT Campus Süd
Engelbert-Arnold-Str. 5
Geb. 11.10, Raum 110.3
D-76131 Karlsruhe

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PCIM Europe 2019; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management

"This paper presents a multi-dimensional full automatic semiconductor test bench for accurate semiconductor
loss determination. The test bench is based on the double pulse test and allows the measurement
of conduction losses and switching energies for any current, voltage and temperature combination of the
device under test. A conduction- and switching loss analysis is presented for silicon carbide (SiC)- and
silicon (Si)-based semiconductor devices. Distinct differences of datasheet information and measurement
results demonstrate the significant benefits of the designed test bench for an accurate semiconductor loss
calculation. Afterwards the semiconductor loss calculation results based on the data sheet data and the
measured losses are compared."

44rd Annual Conference of the IEEE Industrial Electronics Society (IECON)

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Titel Typ Betreuer Bearbeiter

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Dominik Woll


Fabian Dudnitzek

Juliane Reich

Kai Hildenbrand

B.Sc. Lu Chen

Felix Kappeler

M.Sc. Fabian Stamer

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Sven Zwick

Moritz Hechler