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Fabian Stamer

M.Sc. Fabian Stamer

Room: 111
Phone: +49 721 608 46858
Fax: +49 721 358854
fabian stamerFjx5∂kit edu

Karlsruher Institut für Technologie (KIT)
Elektrotechnisches Institut (ETI)

KIT Campus Süd
Engelbert-Arnold-Str. 5
Geb. 11.10, Raum 111
D-76131 Karlsruhe

Title Image Source Short Description

2019 21th European Conference on Power Electronics and Applications (EPE'19 ECCE Europe)

This paper presents a new gate driver concept that allows an online, open-loop adjustment of the switching behavior of power semiconductors during operation. An inductive impedance instead of an ohmic impedance enables the required adjustable gate current and thus the desired gate voltage curve. The driver can individually adapt the switching behavior of the transistor to each individual switching edge. Thus for example the dv/dt and di/dt can be influenced, whereby the EMI behavior, the reverse recovery rate, the occurring overvoltage or the switching losses can also be influenced. The new gate driver was compared to a conventional resistive gate driver and the measurement results clearly show the advantages of the proposed driver concept.

PCIM Europe 2019; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management

"This paper presents a multi-dimensional full automatic semiconductor test bench for accurate semiconductor
loss determination. The test bench is based on the double pulse test and allows the measurement
of conduction losses and switching energies for any current, voltage and temperature combination of the
device under test. A conduction- and switching loss analysis is presented for silicon carbide (SiC)- and
silicon (Si)-based semiconductor devices. Distinct differences of datasheet information and measurement
results demonstrate the significant benefits of the designed test bench for an accurate semiconductor loss
calculation. Afterwards the semiconductor loss calculation results based on the data sheet data and the
measured losses are compared."

44rd Annual Conference of the IEEE Industrial Electronics Society (IECON)

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Titel Typ Betreuer Bearbeiter

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zu vergeben

Dominik Woll


Fabian Dudnitzek

Juliane Reich

Kai Hildenbrand

B.Sc. Lu Chen

Felix Kappeler

M.Sc. Fabian Stamer

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Sven Zwick

Moritz Hechler