Elektrotechnisches Institut (ETI)

Sensitivity analysis of an adaptive open loop gate driver to manufacturing related varying IGBT parameters

  • Autor:

    Fabian Stamer, Andreas Liske, Norbert Stadter, Marc Hiller

  • Quelle:

    PCIM Europe digital days 2020

  • Datum: 07-08. Juli 2020, Digital
  • In this paper the sensitivity of a new open loop gate driver is investigated, regarding to insulated gate
    bipolar transistor (IGBT) parameter variation, caused by manufacturing variations. For this purpose, several
    IGBTs of the same type from different batches, managed by the open loop driver are measured. It will
    be shown, that the switching behavior of the IGBTs, driven by the intelligent open loop gate driver differ
    only slightly from each other. So safe operation of different batches of the same IGBT module with the
    investigated open loop gate driver is possible without an adaptation of its control scheme. Furthermore, it
    is shown that the switching behavior of the respective IGBT is determined by the driver and not by the
    parameter variation of the driven IGBTs.