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A multi-dimensional full automatic power semiconductor test bench for accurate semiconductor loss calculation

A multi-dimensional full automatic power semiconductor test bench for accurate semiconductor loss calculation
Author:

Fabian Stamer, Rüdiger Schwendemann, Marc Hiller

Source:

PCIM Europe 2019; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management

"This paper presents a multi-dimensional full automatic semiconductor test bench for accurate semiconductor
loss determination. The test bench is based on the double pulse test and allows the measurement
of conduction losses and switching energies for any current, voltage and temperature combination of the
device under test. A conduction- and switching loss analysis is presented for silicon carbide (SiC)- and
silicon (Si)-based semiconductor devices. Distinct differences of datasheet information and measurement
results demonstrate the significant benefits of the designed test bench for an accurate semiconductor loss
calculation. Afterwards the semiconductor loss calculation results based on the data sheet data and the
measured losses are compared."