A multi-dimensional full automatic power semiconductor test bench for accurate semiconductor loss calculation

  • Author:

    Fabian Stamer, Rüdiger Schwendemann, Marc Hiller

  • Source:

    PCIM Europe 2019; International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management

  • "This paper presents a multi-dimensional full automatic semiconductor test bench for accurate semiconductor
    loss determination. The test bench is based on the double pulse test and allows the measurement
    of conduction losses and switching energies for any current, voltage and temperature combination of the
    device under test. A conduction- and switching loss analysis is presented for silicon carbide (SiC)- and
    silicon (Si)-based semiconductor devices. Distinct differences of datasheet information and measurement
    results demonstrate the significant benefits of the designed test bench for an accurate semiconductor loss
    calculation. Afterwards the semiconductor loss calculation results based on the data sheet data and the
    measured losses are compared."